2009 年 30 巻 6 号 p. 332-338
We report on laser photoemission electron microscopy (PEEM) using magnetic circular dichroism (MCD). Although MCD asymmetry in valence band is generally very small, it can be enhanced using threshold photoemission. We give experimental results for Ni/Cu(001) to show enhanced MCD effect near the threshold. Possible reasons for the mechanism of the enhancement are its energy and angle limited measurement of a specific electron energy state in the threshold photoemission, which can be achieved without an energy analyzer. As an application of the enlarged MCD using laser, we show magnetic domain imaging using PEEM. Due to its high brilliance, the laser MCD PEEM can measure the magnetic domain in a real time, but its explosive photoemission in a short period would deteriorate the special resolution. Finally we show our effort to make time resolved MCD-PEEM experiment in sub ps time resolution, whose time resolution would be much better than that of the state-of-art experiment using synchrotron with MCD-PEEM.