2011 年 32 巻 7 号 p. 459-460
We have investigated the formation of graphene on the SiO2/Si (111) surfaces using scanning tunneling microscopy. When the SiC (111) film [1500 nm] formed on the SiO2 surfaces was annealed at 980oC, graphene layer was obtained on the SiC surface. When the thickness of the SiC film was 5 nm, the graphene was not observed. However, graphene layer was obtained on the SiO2 surfaces after annealing the C-covered SiC (111) [5 nm] film on the SiO2/Si (111) surfaces at 980oC.