特集：顕微計測の最前線
絶縁性試料の光電子顕微鏡（PEEM）観測
2013 年 34 巻 11 号 p. 586-591
詳細
2013 年 34 巻 11 号 p. 586-591
The observation method of photoemission electron microscopy (PEEM) on insulating samples has been established by introducing simple Au pattern evaporation equipment. Surface conductivity is induced locally on an insulating surface by continuous radiation of soft x-rays, and Au films close to the area of interest allow the accumulated charges to be released to a ground. Using this technique, all usersʼ experiments on poorly conducting samples have been performed successfully at the PEEM experimental station in SPring-8.
