APM Observation of the Surface Structure of Insulating Powders

Yasushi NAKANO; Kazuo SUGIYAMA; Yasushi TAKEUCHI; Tsuneo MATSUDA

doi:10.1380/jsssj.14.342

AFMによる絶縁性粉体の表面形状観察

中野寧, 杉山和夫, 竹内康, 松田常雄

著者情報

ジャーナルフリー

1993 年 14 巻 6 号 p. 342-346

DOI https://doi.org/10.1380/jsssj.14.342

詳細

発行日: 1993/08/10 受付日: 1993/03/09 J-STAGE公開日: 2009/08/07 受理日: 1993/05/06 早期公開日: - 改訂日: -
訂正情報
訂正日: 2009/08/07 訂正理由: - 訂正箇所: 論文抄録訂正内容: Wrong : A new method for the observation of surface morphology of insulating ceramic powders by means of atomic force microscopy (AFM) has been proposed. Several parameters for the measurements, such as the fixation methods of powders on a steel holder, the removing effect of static electricity and the influence of scan rates in AFM operation were examined. The quality of AFM images depended on how the powders were supported. In particular, a clear image was obtained when the powder was rigidly fixed on the holder by use of commercially available epoxy-type adhesives having Shore hardness values of 85 or above. Removal of static electricity by the combined use of an ion-blower and a conductive tip and also by slow-moving scanning of a probe led to a better clarity of the image. A detailed surface morphology (30nm × 3Onm) of silica fine powder could be obtained with a high resolution under the optimized operative conditions for AFM observation.
Right : A new method for the observation of surface morphology of insulating ceramic powders by means of atomic force microscopy (AFM) has been proposed. Several parameters for the measurements, such as the fixation methods of powders on a steel holder, the removing effect of static electricity and the influence of scan rates in AFM operation were examined. The quality of AFM images depended on how the powders were supported. In particular, a clear image was obtained when the powder was rigidly fixed on the holder by use of commercially available epoxy-type adhesives having Shore hardness values of 85 or above. Removal of static electricity by the combined use of an ion-blower and a conductive tip and also by slow-moving scanning of a probe led to a better clarity of the image. A detailed surface morphology (30nm × 3Onm) of silica fine powder could be obtained with a high resolution under the optimized operative conditions for AFM observation.

抄録

A new method for the observation of surface morphology of insulating ceramic powders by means of atomic force microscopy (AFM) has been proposed. Several parameters for the measurements, such as the fixation methods of powders on a steel holder, the removing effect of static electricity and the influence of scan rates in AFM operation were examined. The quality of AFM images depended on how the powders were supported. In particular, a clear image was obtained when the powder was rigidly fixed on the holder by use of commercially available epoxy-type adhesives having Shore hardness values of 85 or above. Removal of static electricity by the combined use of an ion-blower and a conductive tip and also by slow-moving scanning of a probe led to a better clarity of the image. A detailed surface morphology (30nm × 3Onm) of silica fine powder could be obtained with a high resolution under the optimized operative conditions for AFM observation.

責任著者(Corresponding author)

訂正情報

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