真空
Online ISSN : 1880-9413
Print ISSN : 0559-8516
ISSN-L : 0559-8516
四重極型質量分析計のパターン係数のイオン源による違い
永山 宜史荒木 和彦美馬 宏司
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ジャーナル フリー

1997 年 40 巻 8 号 p. 650-654

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A new method is proposed for the derivation of mass spectrum cracking pattern which is supposed to be possessed by ions in a variety of electron bombardment type ion sources. The cracking pattern of Argon in grid type, axial type and Nier type ion source is obtaind. The pattern coefficient was derived from partial ionization cross section of the sample gas with aid of l-V distribution data of ionizing electron, which represents the specific ionizing electron path length li of an electron having an energy of eVi.
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