Journal of the Vacuum Society of Japan
Online ISSN : 1882-4749
Print ISSN : 1882-2398
ISSN-L : 1882-2398
解説
Electron Cyclotron Resonance Plasma を用いたシリコン深掘り技術
遠田 豊古瀬 宗雄高田 和男堤 貴志
著者情報
ジャーナル フリー

2010 年 53 巻 7 号 p. 435-440

詳細
抄録
  Hitachi High-Technologies released a new dry plasma etcher designated as the Hitachi M-6180 and targeted for deep silicon trench etch. The new Hitachi M-6180 deep trench etcher provides for excellent uniformity, superior trench profiles, and high selectivity. The Hitachi M-6180 is based on an ECR (Electron Cyclotron Resonance) plasma source able to generate a high density (1×1011 cm-3) plasma at 0.01 Pa. The low temperature and low pressure reactions of the Hitachi M-6180 achieve superior trench profiles with no sidewall residue. The clean nature of the Hitachi M-6180 ECR etch chamber allows for Mean Time Between Wet Cleaning (MTBW) that is extremely long and particle levels that are very low.
著者関連情報
© 2010 一般社団法人日本真空学会
前の記事 次の記事
feedback
Top