円偏光光電子顕微鏡による磁性体解析

抄録

  Photoelectron emission microscope (PEEM) is used to analyze ferromagnetic materials by using circularly polarized x-ray and utilizing x-ray magnetic circular dichroism (XMCD) effect. At first, the principles of PEEM and XMCD are explained, and the features of PEEM are mentioned. Then, as examples of PEEM application to ferromagnetic material analysis, recent two results are introduced: the observation of magnetic domain structure and elemental distribution on FeNi alloys processed by high-pressure torsion; the magnetic domain observation of FeCo thin films fabricated by alternate monoatomic layer deposition.