直線偏光光電子顕微鏡による反強磁性体磁区の観察

抄録

  A magnetic domain imaging method using linearly polarized light is introduced. Combination of linearly polarized synchrotron radiation and photoemission electron microscope (PEEM) allows us to image domains not only for ferromagnetic (FM) but also for antiferromagnetic (AFM) materials. Since element specific observation is possible, magnetic properties of specified atoms in interfaces are easily investigated. This method is utilized for the study of the magnetic coupling at interfaces between FM surface and AFM substrates. Examples of imaging for AFM domains on NiO(001), and Fe/NiO(001) interface systems are introduced. The spin orientation in domain walls of AFM NiO is also observed.