Abstract book of Annual Meeting of the Japan Society of Vacuum and Surface Science
Online ISSN : 2434-8589
Annual Meeting of the Japan Society of Vacuum and Surface Science 2019
Session ID : 1Bp08
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DUV excimer laser processing for semiconductor package
*Junichi FujimotoAkira SuwaMasakazu KobayashiYasufumi KawasujiHakaru Mizoguchi
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract

Recently infrared/UV laser has faced resolution limit of finer micromachining requirement on especially semiconductor packaging like Fan-Out Wafer/Panel Level Package and Through Glass/Fused silica Via hole for 5G tele communication and high-performance PC. In this study, we have investigated ablation rate with deep ultraviolet excimer laser to explore its possibilities of micromachining on organic and glass/fused silica interposers.We have succeeded 3um holes on organic film aspect ratio >2 and 10 um hole aspect ratio >50 on glass/fused silica interposer without any significant defects. DUV Excimer lasers could be expected on manufacturing process for next generation semiconductor packages.

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© 2019 The Japan Society of Vacuum and Surface Science
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