レーザー研究
Online ISSN : 1349-6603
Print ISSN : 0387-0200
ISSN-L : 0387-0200
レーザーオリジナル
パルスEUV光を用いた光電子分光(EUPS)
富江 敏尚錦織 健太郎李 東勳林 景全松嶋 功森脇 大樹屋代 英彦
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2004 年 32 巻 12 号 p. 793-798

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Photoelectron spectroscopy gives information on electronic states of materials which control properties of materials and devices. Developments of EUV optics and high brilliant pulsed EUV sources in these days have enabled us to develop a new photoelectron spectroscopy, EUPS. With EUPS, we can achieve sub-μm spatial resolution, which is more than one order of magnitude better than that of a commercial XPS. EUPS can observe one mono-layer surface, and ultra-fast phenomena. In this article, after explaining the principle of EUPS, experimental results on observation of chemical shifts, detection of ultra-low level contamination, observation of laser ablation are described. Studies for improving spatial resolution and energy resolution of EUPS are also described.
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© 2004 一般社団法人 レーザー学会
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