Journal of the Mass Spectrometry Society of Japan
Online ISSN : 1880-4225
Print ISSN : 1340-8097
ISSN-L : 1340-8097
解説
TG-MSによるセラミック薄膜および粉体の形成過程の解明
澤田 豊西出 利一松下 純一
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ジャーナル フリー

1998 年 46 巻 4 号 p. 289-291

詳細
抄録
Applicability and prospect of TG-MS (Thermogravimetry coupled with Mass Spectrometry) was discussed by focusing to ceramic thin films and fine powders. TG-MS is applicable to clarify the formation process of the metal oxide films from the precursors which were, for example, dip-coated onto the substrate. TG-MS was discussed in comparison with the TDS (Thermal Desorption Spectroscopy) which was widely applied to the analysis of thin films. The investigation of the formation process of ceramic fine powders using TG-MS was also referred.
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© 1998 日本質量分析学会
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