抄録
In the last decade, electron cyclotron resonance ion sources (ECRISs) have been developed from complex prototype to compact and high perfromance ion source. They can produce the intense beams of heavy ions from most elements of the periodic table with high ionization efficiency. These features are great advantages as an ion source for trace element analysis. Futhermore, when we accelerate the highly charged heavy ions produced from ECRIS with using heavy ion linear accelerator, we can identify many kinds of trace elements simulteneously with very low background. In this paper, we demonstrate the new experimental method for trace element analysis using ECRIS and heavy ion linear accelerator.
