Materia Japan
Online ISSN : 1884-5843
Print ISSN : 1340-2625
ISSN-L : 1340-2625
Microscopic Characterization of Schottky Barrier Height by Scanning Internal-Photoemission Microscopy
Tsugunori Okumura
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Keywords: Schottky barrier height, Scanning internalphotoemission microscopy, photoresponse, titanium/platium/gold, GaAs, epitaxial aluminum film, silicon, metal-semiconductor interface
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1995 Volume 34 Issue 7 Pages 883-888

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