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Volume 34, Issue 7

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[title in Japanese]

Masanori Murakami, Shigeaki Zaima

1995 Volume 34 Issue 7 Pages 825
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.825

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Impurity and Micro Area Analysis in Secondary Ion Mass Spectrometry

Kazuyoshi Tsukamoto, Fumiyo Tohjou, Yoshiaki Yoshioka

1995 Volume 34 Issue 7 Pages 826-830
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.826

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Metal/semiconducter interfaces studied by high-energy ion scattering · channeling technique

Toshimichi Ito, Akio Hiraki

1995 Volume 34 Issue 7 Pages 831-836
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.831

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Coherent Nano-beam Electron Diffraction and its Application to Multi-layer Films

Nobuo Tanaka, Koji Kimoto

1995 Volume 34 Issue 7 Pages 837-842
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.837

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Evaluation of Microstructure of Interface by TEM

Osamu Ueda

1995 Volume 34 Issue 7 Pages 843-847
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.843

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Microscopic Investigation of Interfaces with Ballistic Electron Emission Microscope

Yukio Hasegawa, Toshio Sakurai

1995 Volume 34 Issue 7 Pages 848-851
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.848

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Micro-probe AES and AEM analysis of ULSI devices

Norio Hirashita

1995 Volume 34 Issue 7 Pages 852-856
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.852

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Characterization of Interface Electron Structure by Photon-and Electron-Spectroscopies

Motohiro Iwami

1995 Volume 34 Issue 7 Pages 857-861
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.857

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Metal/Semiconductor Interfaces Studied by X-Ray Diffraction

Koichi Akimoto

1995 Volume 34 Issue 7 Pages 862-866
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.862

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Simultaneous Analysis of Crystal Structure, stress and Contamination at micro Region by Fluorescent and Diffracted X-ray Spectrometer

Naoki Yamamoto

1995 Volume 34 Issue 7 Pages 867-871
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.867

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Interface Structural Study by Diffraction Anomalous Fine Stnlcture (DAFS)

Junichiro Mizuki

1995 Volume 34 Issue 7 Pages 872-877
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.872

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Analysis of Silicide/Silicon Interfacial Stractures Using Medium-Energy Ion Scattering

Shigeaki Zaima

1995 Volume 34 Issue 7 Pages 878-882
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.878

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Microscopic Characterization of Schottky Barrier Height by Scanning Internal-Photoemission Microscopy

Tsugunori Okumura

1995 Volume 34 Issue 7 Pages 883-888
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.883

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Raman Micro-analysis of Residual Stress in Semiconducting Materials and Devices

Yoshiro Akagi, Yasunari Okamoto

1995 Volume 34 Issue 7 Pages 889-894
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.889

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Electric properties of ultra-fine electrode

Characterization of Schottky contact for ultra-fine W-Al electrode on GaAs

Tamotsu Kimura, Tomoyuki Ohshima

1995 Volume 34 Issue 7 Pages 895-899
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.895

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Characterization of defects in Semiconductors by means of electron beam excitation

Takashi Sekiguchi

1995 Volume 34 Issue 7 Pages 900-904
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.900

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Magnetism and Martensitic Transformation of Iron Particles in a Copper Matrix; Yoshimi Watanabe

Yoshimi Watanabe

1995 Volume 34 Issue 7 Pages 905-909
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.905

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Austempered Spheroidal Graphite Cast Steel-A new cast material superior to ADI;

Toshio Takahashi

1995 Volume 34 Issue 7 Pages 910-911
Published: July 20, 1995
Released on J-STAGE: August 11, 2011

DOIhttps://doi.org/10.2320/materia.34.910

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