Microstructure Analysis of Graded Interface Layers in a Model Multilayer Al/Al–Zn/Al Sample by Scanning Microbeam Small-Angle X-ray Scattering Measurements

Abstract

The distribution of precipitation microstructures in the interdiffusion layer of Al/Al–Zn alloy/Al model multilayer was examined using microbeam small-angle X-ray scattering (SAXS) measurements. The change of scattering profiles across the graded interfacial layers reflected the spatial change in the volume fraction, average size, and size distribution in the sample. Microstructural parameters obtained from the SAXS analysis explained the hardness change in the interface area. The present results suggest that small-angle scattering analysis using a scanning microbeam is a useful tool to examine the microstructural distribution and predict the properties of the interface region in multilayer composite sheets, in particular, the microstructure and properties of transient interfacial layers.

Fig. 6 Different strengthening mechanism plots after solution treatment at 350°C.