Ion Release and Buffering Capacity of S-PRG Filler-containing Pit and Fissure Sealant in Lactic Acid

抄録

A nano-filled resin composite is strengthened by the nano-sized filler particles. Ion release and buffering capacity of functional filler-containing fissure sealants (FSs) were studied. Three resin sealants (S-PRG filler-containing FS: BeautiSealant (BS), DELTON (DE), Teethmate F1-2.0 (TM) and a glass-ionomer cement sealant; Fuji III LC (III LC) were prepared. Disks of 13 mm in diameter and 1 mm in thickness (n=4) were incubated for 24 hours into 5 mL lactic acid of pH 4.0 at 37°C. ICP ion analysis revealed that BS released large amounts of Si, Sr, Al, B and Na. III LC released large amounts of Si, Sr, Al and Na. DE released large amount of Na. TM released the smallest amounts of ions. Fluoride measured by an ion meter showed a higher value in III LC than in BS, DE or TM. The filler-containing sealants showed a substantial increase from the initial pH 4.0 of lactic acid toward neutral pH, demonstrating buffering capacity of sealants. Such changes were accompanied by modest release of alkaline ions. This was outstanding in BS. S-PRG technology enables the formation of a stable glass-ionomer phase on the surface of multi-functional glass particles, maintaining their basic properties.