Imaging a Reflecting Plate Located in Scattering Media Using Optical Frequency Domain Reflectometry

Abstract

A new imaging system based on optical frequency domain reflectometry is presented. The intensity-integration effect of the charge coupled device camera to be used acts effectively as a low pass filter for the intensity fluctuation and the 2nd order moment of the detected signals is proportional to a low beat frequency component of the interference signal. Consequently, two-dimensionally imaging of the reflectance of a selective plane located in scattering media is demonstrated.