抄録
Characteristic growth patterns, observed on the as-grown surfaces of synthetic quartz, were studied by means of Lang's X-ray diffraction topograph method. We were particu-larly concerned with the growth pattern and it's interior texture on Z-{00.1} surface.
A topographic correspondence was recog-nized between the optical surface topograph and the X-ray diffraction topograph. The reason, why a good correspondence was ob-tained, can be interpreted in terms of inhomo-geneous distribution of lattice distortion.
