抄録
Electron Probe Micro Analysis was applied to detect impurity distributions in synthetic quartz.
It was found that (1) impurities such as Al, Fe and Na concentrate near the as-grown surface more than in the interior (2) there is a clear topographic correspondence between secondary electron emission image and Kα, X-ray image of Al and Fe, and (3) impurities are preferentially precipitated along the grooves of growth hillocks observed on the (00.1) face.
These can be accounted for as an over-growth phenomenon, during the hydrothermal growth of the crystal.
