抄録
Ca-Si-O films were prepared by a vertical cold-wall type CVD apparatus using organometallic precursors of Ca(dpm)2 and tetra ethyl orthosilicate (TEOS). The effects of molar ratio (RCa/Si) in precursors and substrate temperature (Tsub) on the crystal phase, microstructure and deposition rate of Ca-Si-O films were investigated. Ca2SiO4 films in a main phase were obtained at Tsub= 8500C and RCa/Si = 1.12 to 5. With increasing Tsub, Ca3SiO5 and CaSiO3 phases were formed at Tsub= 9500C to 10500C and RCa/Si = 0.14 to 5. With increasing RCa/Si, the microstructure changed from a cauliflower like to smooth/granular type texture. The maximum deposition rate was about 240 micro meter h-1 at Tsub=10500C, and RCa/Si= 0.36.