Percolation threshold for electrical resistivity and photocurrent density of Ag nanoparticle/titania

抄録

In order to find the percolation threshold for the electrical resistivity and to study the photocurrent density of metallic Ag-nanoparticle/titania composite thin films, different volumetric fractions of silver (0.00 ≤ φ_Ag ≤ 0.68) to titania thin films, were fabricated on a quartz glass substrate at 600°C using the molecular precursor method. The resistivity of the films was of the order of 10^-2 to 10^-5 Ω cm at 25°C. The percolation threshold was identified at a φ_Ag value of 0.30. Photocurrent density of the Ag-NP/TiO₂ composite thin films was drastically changed and depended on the volumetric fractions of silver.