Journal of Photopolymer Science and Technology
Online ISSN : 1349-6336
Print ISSN : 0914-9244
ISSN-L : 0914-9244
Improvement of Post-Exposure Delay Stability in Alicyclic ArF Excimer Photoresists
Mikio YamachikaKyle PattersonSungseo ChoTimo RagerShintaro YamadaJeffrey ByersP. J. PaniezB. MortiniS. GallyP-O. SassoulasC. Grant Willson
Author information
JOURNAL FREE ACCESS

1999 Volume 12 Issue 4 Pages 553-560

Details
Abstract
This paper reports work toward designing environmentally stable alicyclic polymer-based photoresists for ArF excimer laser lithography. A design concept for improving post-exposure delay stability is suggested in this paper. The polymers described here were prepared from dinorbornene derivatives and maleic anhydride by free radical polymerization. The relationship among polymer structure, glass transition temperature (Tg) and post-exposure delay stability was studied. This new polymer design offers a pathway towards good post-exposure delay stability while maintaining high resolution.
Content from these authors
© The Technical Association of Photopolymers, Japan
Previous article Next article
feedback
Top