Proceedings of JSPE Semestrial Meeting
2011 JSPE Spring Conference
Session ID : O50
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Host: The Japan Society for Precision Engineering

Development of compact inner profile instrument using ring beam device (4th report)
Trial to scratch inspection
Toshitaka Wakayama, *Yuta Kikuchi, Yoshihisa Kamakura, Toru Yoshizawa
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Keywords: inner profile measurement
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[in Japanese]
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© 2011 The Japan Society for Precision Engineering
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