Proceedings of JSPE Semestrial Meeting
2014 JSPE Spring Conference
Session ID : A79
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Host: The Japan Society for Precision Engineering

Influence of charged sample on imaging of scanning ion conductance microscopy
*Kimihiro Ishizaki, Masato Nakajima, Tatsuo Ushiki, Futoshi Iwata
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Keywords: Scanning ion conductance microscopy
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[in Japanese]
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© 2014 The Japan Society for Precision Engineering
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