Minimal Test Set Generation by Hashing for R-Valued PLAs
キーワード:
Multiple-Valued Logic,
Programmable Logic Array,
Test Vector Generation,
Minimal Test Set,
Hashing
2005 年 27 巻 6 号 p. 435-443
詳細
2005 年 27 巻 6 号 p. 435-443
For fault diagnosis in R-valued PLAs (R≥2), we construct a test table with rows of test vectors each giving activated product lines and normal output values of the programmed functions. Test vector generation for constructing the test table is based on product-oriented test generation which was proposed by Min and Fujiwara for binary PLAs. The number of test vectors is less than or equal to k・(n・R-1) where k is the number of product lines in an R-valued n variable PLA. The procedure to construct the test table is based on a hash method on the generated tests. By combining tests in the table, fault diagnosis of the PLA can be performed efficiently.
