生産研究
Online ISSN : 1881-2058
Print ISSN : 0037-105X
ISSN-L : 0037-105X
研究解説
Photo-assisted Scanning Probe Microscopies on Solar Cells
髙橋 琢二
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ジャーナル フリー

2015 年 67 巻 5 号 p. 539-544

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We performed photo-assisted Kelvin probe force microscopy and photothermal atomic force microscopy on Cu(In,Ga)Se2 [CIGS] solar cells to investigate their local photovoltaic properties and photo-carrier dynamics. By means of those techniques, the spatial distribution and temporal decay of photovoltage as well as the nonradiative recombination properties in the CIGS solar cells were examined. As a result, the spatial separation effect of photo-carriers and the contribution of fast process in the whole recombination processes of photocarriers in the CIGS solar cells have been discussed, and the possibility that sub-gap states with discrete energy levels exist in the CIGS material has been pointed out.

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© 2015 Institute of Industrial Science The University of Tokyo
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