All-optic UHV Atomic Force Microscopy.

抄録

Non-contact mode Atomic Force Microscopy is a very useful tool for precise measurement and mapping of the tip-sample interaction force. In the laboratory, several works were focused on the use of all-optic UHV AFMs for atomic resolution imaging with high frequency （1-200 MHz） and low amplitude of drive （10-100 pm）. We recently implemented a new all-optic AFM for the measurement of gradient of frequency shifts and as a new tool for the development of innovative chemical contrast techniques. Two all-optic AFMs were also implemented into a Transmission Electron Microscope （TEM） and a Field Ion Microscope （FIM） for new applications in the field of surface chemistry. All the technical aspects covering high resolution imaging with all-optic AFM will be discussed in the former part of this review and their new implementations for gradient of frequency shift measurement in the latter.