SPring-8/SACLA Research Report
Online ISSN : 2187-6886
Section B
Depth Analysis of the Gd Doped AlN Thin Film for Deep Ultraviolet Light by Hard X-ray Photoelectron Spectroscopy (3)
Mikihiro KobayashiTsuguo IshiharaHirokazu IzumiTetsuro NishimotoHiroyuki TanakaTakashi KitaShinya KitayamaKuniyuki Ichii
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Keywords: HAXPES, 2012A1776, BL46XU
JOURNAL OPEN ACCESS

2013 Volume 1 Issue 3 Pages 173-177

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[in Japanese]
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