SPring-8/SACLA Research Report
Online ISSN : 2187-6886
Section B
Influence of X-ray Irradiation for Bias-applied Hard X-ray Photoelectron Spectroscopy of Si-MOS
Keita Kataoka, Noritake Isomura, Masakazu Kanechika, Hiroyuki Ueda
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Keywords: HAXPES, MOS, 2016A4801, 2017A5071, BL15XU, BL16XU
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2022 Volume 10 Issue 1 Pages 71-75

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Abstract
[in Japanese]
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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
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