Wavelength Dispersive X-ray Spectrometer for Measuring X-ray Magnetic Circularly Polarized Emission

抄録

　A feasibility study on a wavelength dispersive x-ray spectrometer for measuring x-ray magnetic circularly polarized emission (XMCPE) is reported. An advantage of this spectrometer is that XMCPE spectra at various emission lines for different elements can be measured relatively easily. Two experiments at the Sm Lα_1,2 and Co Kα_1,2 emissions were conducted. However, we failed to observe XMCPE spectra. Instead, we found a significant difficulty in adjusting the spectrometer and therefore conclude that this spectrometer is unsuitable for practical measurements.