Section B
Analysis of Interface Condition on GaN Based Electron Devices by Micro Beam XAFS
Yasunori Tateno, Junji Iihara, Takumi Yonemura, Aiko Tominaga, Yoshihiro Saito, Tsuyoshi Kochi, Yukihiro Tsuji, Hitoshi Osawa, Tomoya Uruga
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2015 Volume 3 Issue 2 Pages 464-468
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