粉体工学会誌
Online ISSN : 1883-7239
Print ISSN : 0386-6157
ISSN-L : 0386-6157
画像法による粒子径分布測定に及ぼす粒子重複測定の影響
椿 淳一郎森 英利杉本 理充前田 俊介早川 修
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1998 年 35 巻 5 号 p. 346-352

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The present paper describes the statistical simulation results for the deviation of the sample size destribution function, which stems from the multiple counting of particles in the measurement of particle sizes by using a microscopy method. The multiple counting factor expected for a sufficient number of measurements depends strongly on the apparent measuring fraction, irrespective of the sample size projected in the unit measurement area. Although the multiple counting factor increases with an increase in the apparent measuring fraction, the deviation in the sample size distribution function decreases gradually because there is a suffcient number of observed particles. It is concluded that, for practical usage, sampling conditions of the apparent measuring fraction of>0.2 reasonably insure a deviation of<3% for the sample size distribution function.
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