抄録
In this paper, a probabilistic signal processing method which is possible to give any methodological suggestion to the measurement method of compound and/or accumulation effect in electromagnetic environment is discussed. In order to extract latent various interrelation characteristics between waved environmental factors (sound, light and electromagnetic wave) leaked from the real operation VDT, an extended regression system model reflecting hierarchically not only linear correlation information of the lower order but also nonlinear correlation information of the higher order is firstly introduced. Then, through identifying each regression parameter of this model under two different environments (with and without a background noise), two evaluation methods for predicting the fluctuation distribution from the one to the other between above-mentioned waved environmental factors are newly proposed. Finally, the validity and effectiveness of this proposed methods are experimentally confirmed too by applying it to the actually observed data leaked by a VDT with some television games in the room of an actual working environment.
