抄録
Two types of x-ray diffraction methods for measuring stress state in a single crystal are proposed. The first one is tuned to the laboratory x-ray diffraction system. The diffraction data for several equivalent diffraction indices are obtained by using our original apparatus and the multiple regression analysis method is applied for the solution algorism of the plane stress components. The second one is suitable for investigating the residual stress state in an inner part of a single crystal by using high energy synchrotron radiation facility. The stress components can be directly analyzed by solving the stress-strain equation for a single crystal with the diffraction data in three orthogonal directions. The experimental demonstrations are also shown for the residual stress analysis of laser-irradiated Fe single crystal.
