抄録
Determining electron density in a material model-independently by X-ray diffraction has been a critical problem and actively studied since the middle of the 20th century. All the information that can be experimentally obtained by X-ray diffraction is only on intensity distribution, so that the information on the phase of scattering amplitude is lost, which prevents us from retrieving electron density model-independently. This is the so-called 'phase problem'. The phase problem in surface and interface crystallography has been one of interesting subjects in recent years. The present paper will focus on recent progress in solving the phase problem in surface and interface crystallography.
