IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Special Section on Recent Development of Electro-Mechanical Devices (Selected Papers from IS-EMD2009)
The Discrimination of Contact Failure Mechanisms by Analyzing the Variations of Time Parameters for Relays
Shujuan WANGQiong YUGuofu ZHAI
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2010 Volume E93.C Issue 9 Pages 1437-1442

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Abstract
Usually the contact voltage drop or contact resistance of electromagnetic relays is observed only to identify if the contacts are failure or not on the manufactures' life tests. However, it is difficult to reveal the contact performance degradation because the variation of contact resistance may not be obvious. In this paper, a new life test technology was investigated to analyze the contact failure mechanisms and degenerative processes of electromagnetic relays by measuring their time parameters including closing time, opening time, over-travel time, rebound duration and gap time during each operation. Moreover, for the purpose of verifying the time parameters, the contact motion and contact morphology during life test were record by using a high speed camera. Both the variations of time parameters and information obtained from photos taken by high speed camera show that it involves three different degenerative phases during the whole life of a relay. The results also indicate this method is an effective technology to discriminate and diagnose the failure mechanisms for electromagnetic relays.
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© 2010 The Institute of Electronics, Information and Communication Engineers
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