IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Special Section on Recent Development of Electro-Mechanical Devices (Selected Papers from IS-EMD2009)
Observation of Tin Plated Fretting Contacts Using FIB-SEM
Tetsuya ITO, Yoshiyuki NOMURA, Yasuhiro HATTORI
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Keywords: fretting, FIB-SEM, tin plating thickness
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2010 Volume E93.C Issue 9 Pages 1452-1455

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Abstract
In this report, Focused Ion Beam (FIB) — SEM technique was applied to observe the tin plated fretting contacts. Spatial distributions of tin, tin oxide and so on have been confirmed quantitatively in two plating thickness of 1 and 5µm.
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© 2010 The Institute of Electronics, Information and Communication Engineers
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