IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Regular Section
A 50ns Verify Speed in Resistive Random Access Memory by Using a Write Resistance Tracking Circuit
Shyh-Shyuan SHEUKuo-Hsing CHENGYu-Sheng CHENPang-Shiu CHENMing-Jinn TSAIYu-Lung LO
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2012 年 E95.C 巻 6 号 p. 1128-1131

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抄録
This paper proposes a write resistance tracking circuit (WRTC) to improve the memory window of HfOx-based resistive memory. With a 50-ns single voltage pulse, the minimal resistance of the high resistance state in the 1-kb array of resistive switching elements can increase from 25kΩ to 65kΩ by using the proposed verify circuit. The WRTC uses the transition current detection method based on the feedback of the memory cell to control the write driver. The WRTC achieves distinct bistable resistance states, avoids the occurrence of over-RESET, and enhances the memory window of the RRAM cell.
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© 2012 The Institute of Electronics, Information and Communication Engineers
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