抄録
A loosened connector between interconnected electric devices causes an increase in electromagnetic radiation when the devices operate in high-frequency bands. To develop a high-frequency circuit equivalent to a connector with contact failure, we previously investigated the parasitic elements caused by failure at the contact boundary. From the results of that study, the inductance and resistance at a connection contact boundary are increased by the loosening of a connector. Furthermore, the increase in inductance is the dominant factor in increasing the intensity of the electromagnetic radiation. In this paper, to suppress electromagnetic radiation resulting from a loose contact, we formulate the contact performance requirement needed to maintain a good contact condition when a small loosening has occurred at the interconnection. To this end, we investigate the mechanism of increase in the inductance by loosening the connector.
