IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Special Section on Analog Circuits and Related SoC Integration Technologies
Two-Tone Signal Generation for ADC Testing
Keisuke KATOFumitaka ABEKazuyuki WAKABAYASHIChuan GAOTakafumi YAMADAHaruo KOBAYASHIOsamu KOBAYASHIKiichi NIITSU
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2013 Volume E96.C Issue 6 Pages 850-858

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Abstract

This paper describes algorithms for generating low intermodulation-distortion (IMD) two-tone sinewaves, for such as communication application ADC testing, using an arbitrary waveform generator (AWG) or a multi-bit ΣΔ DAC inside an SoC. The nonlinearity of the DAC generates distortion components, and we propose here eight methods to precompensate for the IMD using DSP algorithms and produce low-IMD two-tone signals. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of our approach.

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© 2013 The Institute of Electronics, Information and Communication Engineers
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