IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Special Section on Electronic Displays
Thickness of Crystalline Layer of Rubbed Polyimide Film Characterized by Grazing Incidence X-ray Diffractions with Multi Incident Angles
Ichiro HIROSAWATomoyuki KOGANEZAWAHidenori ISHII
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2014 Volume E97.C Issue 11 Pages 1089-1092

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Abstract
Thickness of crystalline layer induced by annealing after rubbing at surface of polyimide film for liquid crystal displays was estimated to be 3–5 nm by grazing-incidence X-ray diffractions with multi incident angles. Agreement of thickness of crystalline layer with that of initially oriented layer suggests polymer orientation induced by rubbing proceeds crystallization by annealing. Furthermore, no in-plane smectic ordering in bottom 20 nm region of polyimide film was suggested.
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© 2014 The Institute of Electronics, Information and Communication Engineers
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