IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Special Section on Microwave Photonics
Millimeter-Wave Ellipsometry Using Interface-Planarization Prism
Hiroshi YAMAMOTOHiroshi ITO
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2015 Volume E98.C Issue 8 Pages 873-877

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Abstract
The use of an interface-planarization (IP) prism in millimeter-wave ellipsometry is proposed to achieve reproducible measurements of soft, protean, and non-flat samples. The complex relative dielectric constants of a slice of bovine tissue were successfully measured at frequencies from 90 to 140 GHz using the IP prism to confirm its applicability. The use of the IP prism was found to be advantageous for protecting the sample surface from the desiccation during the measurements.
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© 2015 The Institute of Electronics, Information and Communication Engineers
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