Exploiting Configurable Approximations for Tolerating Aging-induced Timing Violations

Abstract

This paper proposes a technique that increases the lifetime of large scale integration (LSI) devices. As semiconductor technology improves at miniaturizing transistors, aging effects due to bias temperature instability (BTI) seriously affects their lifetime. BTI increases the threshold voltage of transistors thereby also increasing the delay of an electronics device, resulting in failures due to timing violations. To compensate for aging-induced timing violations, we exploit configurable approximate computing. Assuming that target circuits have exact and approximate modes, they are configured for the approximate mode if an aging sensor predicts violations. Experiments using an example circuit revealed an increase in its lifetime to >10 years.