IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Online ISSN : 1745-1337
Print ISSN : 0916-8508
Special Section on VLSI Design and CAD Algorithms
Bayesian Estimation of Multi-Trap RTN Parameters Using Markov Chain Monte Carlo Method
Hiromitsu AWANOHiroshi TSUTSUIHiroyuki OCHITakashi SATO
著者情報
ジャーナル 認証あり

2012 年 E95.A 巻 12 号 p. 2272-2283

詳細
抄録
Random telegraph noise (RTN) is a phenomenon that is considered to limit the reliability and performance of circuits using advanced devices. The time constants of carrier capture and emission and the associated change in the threshold voltage are important parameters commonly included in various models, but their extraction from time-domain observations has been a difficult task. In this study, we propose a statistical method for simultaneously estimating interrelated parameters: the time constants and magnitude of the threshold voltage shift. Our method is based on a graphical network representation, and the parameters are estimated using the Markov chain Monte Carlo method. Experimental application of the proposed method to synthetic and measured time-domain RTN signals was successful. The proposed method can handle interrelated parameters of multiple traps and thereby contributes to the construction of more accurate RTN models.
著者関連情報
© 2012 The Institute of Electronics, Information and Communication Engineers
前の記事 次の記事
feedback
Top