Classifying Insects from SEM Images Based on Optimal Classifier Selection and D-S Evidence Theory

Abstract

In this paper, an insect classification method using scanning electron microphotographs is presented. Images taken by a scanning electron microscope (SEM) have a unique problem for classification in that visual features differ from each other by magnifications. Therefore, direct use of conventional methods results in inaccurate classification results. In order to successfully classify these images, the proposed method generates an optimal training dataset for constructing a classifier for each magnification. Then our method classifies images using the classifiers constructed by the optimal training dataset. In addition, several images are generally taken by an SEM with different magnifications from the same insect. Therefore, more accurate classification can be expected by integrating the results from the same insect based on Dempster-Shafer evidence theory. In this way, accurate insect classification can be realized by our method. At the end of this paper, we show experimental results to confirm the effectiveness of the proposed method.