IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Online ISSN : 1745-1337
Print ISSN : 0916-8508
Special Section on Mathematical Systems Science and its Applications
Diagnosis of Stochastic Discrete Event Systems Based on N-Gram Models with Wildcard Characters
Kunihiko HIRAISHIKoichi KOBAYASHI
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2016 Volume E99.A Issue 2 Pages 462-467

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Abstract

In previous papers by the authors, a new scheme for diagnosis of stochastic discrete event systems, called sequence profiling (SP), is proposed. From given event logs, N-gram models that approximate the behavior of the target system are extracted. N-gram models are used for discovering discrepancy between observed event logs and the behavior of the system in the normal situation. However, when the target system is a distributed system consisting of several subsystems, event sequences from subsystems may be interleaved, and SP cannot separate the faulty event sequence from the interleaved sequence. In this paper, we introduce wildcard characters into event patterns. This contributes to removing the effect by subsystems which may not be related to faults.

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© 2016 The Institute of Electronics, Information and Communication Engineers
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