IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Online ISSN : 1745-1337
Print ISSN : 0916-8508

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Joint BCH and XOR Decoding for Solid State Drives
Naoko KIFUNEHironori UCHIKAWA
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JOURNAL FREE ACCESS Advance online publication

Article ID: 2022EAP1119

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Abstract

At a flash memory, each stored data frame is protected by error correction codes (ECC) such as Bose-Chaudhuri-Hocquenghem (BCH) codes from random errors. Exclusive-OR (XOR) based erasure codes like RAID-5 have also been employed at the flash memory to protect from memory block defects. Conventionally, the ECC and erasure codes are used separately since their target errors are different. Due to recent aggressive technology scaling, additional error correction capability for random errors is required without adding redundancy. We propose an algorithm to improve error correction capability by using XOR parity with a simple counter that counts the number of unreliable bits in the XOR stripe. We also propose to apply Chase decoding to the proposed algorithm. The counter makes it possible to reduce the false correction and execute the efficient Chase decoding. We show that combining the proposed algorithm with Chase decoding can significantly improve the decoding performance.

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