IEICE Transactions on Information and Systems
Online ISSN : 1745-1361
Print ISSN : 0916-8532
Regular Section
A Practical Threshold Test Generation for Error Tolerant Application
Hideyuki ICHIHARAKenta SUTOHYuki YOSHIKAWATomoo INOUE
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2010 Volume E93.D Issue 10 Pages 2776-2782

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Abstract

Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this paper, we propose test generation models for threshold test generation. Using the proposed models, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show that our approach is, in practice, effective.

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© 2010 The Institute of Electronics, Information and Communication Engineers
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