Vacuum and Surface Science
Online ISSN : 2433-5843
Print ISSN : 2433-5835
Special Issue : Secondary Ion Mass Spectrometry (SIMS) —Recent Trends and Organic Analysis—
Development of a Vacuum-type Electrospray Droplet Ion Gun and Its Application to Time-of-flight Secondary Ion Mass Spectrometry
Satoshi NINOMIYAYuichiro TAKAGILee Chuin CHENKenzo HIRAOKA
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2018 Volume 61 Issue 7 Pages 440-445

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Abstract

We have developed a vacuum-type electrospray droplet ion (V-EDI) gun as a novel massive cluster beam for surface analysis instruments in which the beam source is a vacuum electrospray of aqueous solution. The prototype of the V-EDI gun was connected to a time-of-flight analyzer. Secondary ion spectra produced by the V-EDI beams were measured using a sample-bias pulsing method, because a short pulse of the beam could not be obtained. The secondary ion yields of biomolecular samples produced by the V-EDI and Bi cluster ion beams were compared, and the secondary ion yields produced with the V-EDI beams were found to be much higher than those produced with the Bi cluster ion beams.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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