SPM特集号「プローブ顕微鏡が拓く世界」
超高真空AFMの動向と展望
キーワード:
atomic force microscopy,
surface chemistry,
chemical identification,
low dimensional materials
2022 年 65 巻 2 号 p. 59-65
詳細
2022 年 65 巻 2 号 p. 59-65
We will review recent studies in atomic-resolution ultrahigh vacuum AFM over the last decade or so. After a brief description of AFM measurement principles, force sensitivity, instrumentation and performance, recent experimental results will be introduced, divided into three categories by the tip-sample distance.
